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ATF6-PZ Sensor

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聯(lián)系方式:西努光學(xué)查看聯(lián)系方式

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西努光學(xué)創(chuàng)建于2003 年,主營工業(yè)顯微鏡及制樣設(shè)備、鏡片測定設(shè)備,高速攝像系統(tǒng)、工業(yè)內(nèi)窺鏡、機(jī)器視覺等工業(yè)及科研應(yīng)用的檢測設(shè)備及系統(tǒng)集成。
西努光學(xué)秉承“以光學(xué)為核心,為客戶提供解決方案”的經(jīng)驗(yàn)思路,經(jīng)過16年的努力,成為眾多企業(yè)、高校科研單位提供各種專業(yè)化的光學(xué)系統(tǒng)解決方案。并于2012 年導(dǎo)入SAP 管理系統(tǒng),通過系統(tǒng)資源整合,為客戶提供更優(yōu)質(zhì)、快捷的專業(yè)化服務(wù)。
2016 年,我們積極引進(jìn)檢測設(shè)備的同時(shí)導(dǎo)入制樣等配套設(shè)備以豐富我們實(shí)驗(yàn)室平臺(tái),以更好的為客戶提供現(xiàn)場體驗(yàn),從微米到納米滿足客戶從制樣到結(jié)果分析的一站式體驗(yàn)服務(wù)。



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The ATF6PZ SWIFT
WDI’s ATF6PZ SWIFT is a high speed, high accuracy, autonomous digital autofocus sensor. Its “Smart Sensor Architecture” (SSA) incorporates a semiconductor laser, built-in CMOS image sensor, FPGA and microprocessor for fast digital image processing. By projecting a laser line onto the sample and digitally processing the image, the ATF6PZ SWIFT provides fast and precise output to accuray control the focus position of external piezo Z actuators and stages. By supplying an analog output, the sensor can connect and direct a piezo Z device without the need to go through a secondary controller.
High Accuracy At Fast Speeds
WDI’s ATF6PZ SWIFT sensors project their focusing laser directly through the objective lens of the microscope. This “Through The Lens” (TTL) technique allows the sensor to provide extremely accurate autofocus, with a success rate typically higher than 99%. The ATF6PZ SWIFT’s onboard digital processing coupled with an improved faster sampling rate allows it to maintain this accuracy with 3 times the speed of previous versions. As the sensor connects directly to the piezo Z device autofocus times are shortened.
Static or Dynamic Autofocus
The ATF6PZ SWIFT is continually assessing distance and direction to focus, updating its data every 0.15 milliseconds. This allows the sensor to keep samples in focus regardless of whether they are stationary or in motion. This powerful tracking autofocus makes it perfect for scanning very large specimens precisely at very high speeds.
Maximum Flexibility
By projecting a laser line, the AFT6PZ SWIFT sensor operates equally effectively on patterned and un-patterned specimens as well as diffusing and reflective surfaces making it ideal for media such as TFT arrays and photo masks. The sensor also automatically adjusts its laser intensity and sensor expose time, allowing it to adapt from low reflectivity (down to 1%) to highly reflective (99%) surfaces. It is compatible with objectives from 2X to 100X, and wavelengths including UV, NUV and NIR.
Easy Integration
All of the sensors in WDI’s ATF family are designed with ease of integration in mind. They are compatible with most types of infinity corrected microscope objectives. The AFT6PZ SWIFT comes as a stand-alone sensor with analog output for direct connection to an external piezo a Z actuator or stage amplifier. All WDI’s ATF sensors have small, standardized footprints and connections, and can output in either analog or digital formats, making them both easy to install and easy to upgrade as application requirements evolve.
 

ATF6PZ SWIFT AUTO FOCUS & TRACKING SYSTEM

 

ATF6-PZ Sensor
Structured Light PatternLine Segment
Sensor WavelengthChoice of 660nm or 785nm
Image DetectorLine Scan CMOS
Internal Update Rate20kHz
Static Autofocus Accuracy± 1/4 Objective Depth of Focus
Fast Tracking Autofocus Accuracy± 1/2 Objective Depth of Focus

 

General Performance
Output Data Rate6.5kHz
Reflectivity Adaption Delay1ms
Laser TypeSemiconductor
Laser SafetyClass 2 660, 785nm
Weight250g
Dimensions40 X 40 X 120mm
Maximum Cable Length1.8m
ComplianceCE SEMI
External Requirements
Specimen ReflectivitySpecimen Reflectivity
Glass Thickness> 0.5mm
Diffusing SpecimenYes
Specular SpecimenYes
Specular SpecimenYes
Textured SpecimenYes
Operating Specifications
Input Voltage18V to 25V, 24V Nominal
Operating Temperature18°C ~ 35°C
Storage Temperature10°C ~ 45°C
Humidity10% ~ 90% Non Condensing

 

 



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