IPCE）測試系統(tǒng)

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公司名稱 CROWNTECH（美國頤光科技有限公司中國辦事處）
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型號 QTest Station Series
產(chǎn)地 USA
廠商性質(zhì) 其他
更新時間 2017/7/4 20:57:17
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太陽能電池測試光譜響應(yīng)量子效率 QE IPCE

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CROWNTECH(美國頤光科技有限公司)是一家集開發(fā)、制造和銷售光學元器件、光譜儀器、光電設(shè)備和與光學系統(tǒng)有關(guān)的儀器設(shè)備為一體的*，公司自主研發(fā)的太陽能電池測試系統(tǒng)，是目前技術(shù)全面，有完善解決方案的一套系統(tǒng)。憑借測試系統(tǒng)的高性價比以及全面的技術(shù)服務(wù)，我公司太陽能電池（光電材料）測試系統(tǒng)已在國內(nèi)很多單位的實驗室投入使用，包括清華大學等大學、國家的太陽能計量單位、*等研究機構(gòu)以及眾多的太陽能相關(guān)企業(yè)，經(jīng)過大量客戶對我公司太陽能電池（光電材料）測試系統(tǒng)的使用，證明了我公司的太陽能電池（光電材料）測試系統(tǒng)的成熟。

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太陽能電池光譜響應(yīng)/量子效率（QE/IPCE）測試設(shè)備

詳細信息 在線詢價

QTest Station 1000 / 2000 Solar Cell Quantum Efficiency or IPCE Measurement System
Features:	Applicable Photovoltaic Devices:
◆ A turn key, fully automatic QE / IPCE measurement	Silicon
station in compliance with all major international	Si （crystalline）
standards for PV testing, such as ASTM and IEC	Si （multicrystalline）
etc.	Si （thin-film transfer）
◆State of the art system suited for all categories of	Amorphous/nanocrystalline Si
PV devices	Si （amorphous）
◆Multi-junction solar cell measurement	Si （nanocrystalline）
◆Extremely stable light source and high signal to	III–V cells
noise ratio	GaAs （crystalline）
◆Wide spectral range from deep UV to MID-IR,	GaAs （thin film）
extendable to other range	GaAs （multicrystalline）
◆Integrating sphere module for both External QE	InP （crystalline）
and Internal QE testing	Thin-film chalcogenide
◆ Measurement of PV devices with slow time	CIGS （cell）
response, such as dye sensitised	CdTe （cell）
◆Calculation of I_sc under AM0, AM1.5D and AM1.5G	Photochemical
◆ System expandable to PL measurement with	Dye sensitised
optional modules for customers with limited budget	Organic
◆Advanced modular design with a great variety of	Organic polymer
options to best fit the need of individual laboratory	Multijunction devices
◆ Intuitive Interface for operations	GaInP/GaAs/Ge
◆ Appropriate for use in either research and	GaInP/GaAs
development applications or in product quality	GaAs/CIS （thin film）
control by manufacturers	a-Si/mc-S

The spectral responsivity of a photovoltaic device is useful for understanding device performance and materia

characteristics. The quantum efficiency （QE） or IPCE is a quantity defined as the percentage of photons

hitting the photoreactive surface that will produce the current obtained outside the device,and normally reported

over the wavelength range λ.（unit: nm） to which the device responds:

QE（λ） = 1240 R（λ）/λ

In which, R（λ）（unit: A/W） is defined as the output current （short circuit current） per input irradiance

or radiant power at a given wavelength.

QE or IPCE is an accurate measurement of the device's electrical sensitivity to light. The Quantum Efficiency

of a solar cell is a very important measure for solar cells as it gives information on the current that a given cell

will produce when illuminated by a particular wavelength. If the quantum efficiency is integrated （summed） over

the whole solar electromagnetic spectrum, one can evaluate the current that a cell will produce

when exposed to the solar spectrum. The ratio between this current and the highest possible

current （if the QE was * over the whole spectrum） gives the electrical efficiency of the solar cell.

System Specifications:

Wavelength Range	Light Source	250nm – 2500nm, Other Wavelength Optional
	Monochromator	185nm – 3600nm, Others Wavelength Optional
	Calibration Detector	Si: 200 nm – 1100nm
		InGaAs and Others Optional
Wavelength Resolution	0.1nm – 20nm
Stray Light	Single Monochromator, Better Than 10^-4at 220nm （Nal） For QTest 1000
	Double Monochromator, Better Than 10^-9 at 220nm （Nal） For QTest 2000
Sample Illuminating Area	From Sub-millimeter to 156 x156mm or larger, User Changeable
Sample Chamber	D500 x W400 x H250mm, Other Size Optional
Data Acquisition Module	AC Measurement: Lock-in Amplifier Sensitivity: 2 nV to 1 V Current input: 10⁶ or 10⁸ V/A


	DC Measurement: Multimeter / Source Meter and Pre-amplifier
Computer Interface	RS232 Standard, USB and IEEE-488 optional
Software	Hardware Setup and Control: Wavelength Scanning Input / Output Slits Adjustment Gratings changing Filter Wheel Control Setup and Data Collection of Lock-in Amplifier or Multimeter / Source Meter		Data Acquisition: Real Time Display System Calibration Data Analyzing Data Storage Report printing Reflectivity and Transmittance for EQE and IQE
Other options	Temperature Control Multijunction Cell Measurements